Observation of magnetic domains using a reflection-mode scanning near-field optical microscope
نویسندگان
چکیده
It is demonstrated that it is possible to image magnetic domains with a resolution of better than 60 nm with the Kerr effect in a reflection-mode scanning near-field optical microscope. Images taken of tracks of thermomagnetically prewritten bits in a Co/Pt multilayer structure magnetized out-of plane showed optical features in a track pattern whose appearance was determined by the position of an analyzer in front of the photomultiplier tube. These features were not apparent in the topography, showing this to be a purely magneto-optic effect. © 1997 American Institute of Physics. @S0003-6951~97!01310-7#
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